Before all needs in in view of in NOKIA BB5 Phone there are dual of CPU ( omap and rap3g) and dual of Power ( tahvo and retu).

- CHARGING
Tension entering through charger distribute to by indium plug charger would in processing by tahvo, and in continuing to CPU, thus damage cannot fill batt held by tahvo.

- SIGNAL
RF ( hinku, vinku, ahne, pihi).
RF process signal yg then in process by CPU ( rapgsm/rap3g)
RF obtains tension from RETU.
If tension from retu is less, break, or loses at all, hence signal is not exist.
damage of signal can also happened because calibration signal in PM ( pemanen memory) breakdown…… promethium x’self resides in NOR Flash ( usually having capacities 64 mb)

- UI INTERFACE
we divide to become 2 part of control :
—- OMAP ( camera,lcd,mmc…) while data there is in Nand Flash, for example photograph, ringtone, phone book etc.
so damage the thing is upper in general can be correlated with control is upper.
—- RETU ( Vibra,mic,ihf,speaker,sim….)
tension line from retu influences damage is upper.
at the time of flashing, we also applies tension from retu.
this only image of public only, if some’x will add and decomposes more elaborate………… please……….